Freeprobe Probe Series

Optical Probing for Hidden and Hard-to-Reach Features

The FreeProbe Series expands the capabilities of the FreeScan Trak Nova and FreeScan Trak ProW by adding optical probing to the same measurement workflow. While 3D scanners are excellent for capturing freeform surfaces quickly, some features are difficult or impossible to measure reliably using optical scanning alone.

Deep bores, hidden datums, internal corners, threaded holes, recessed features, and hard-to-see geometry often require direct point measurement. The FreeProbe Series allows users to measure these features within the same coordinated environment as their Dynamic Tracking scanner, improving the completeness of inspection and reverse engineering workflows.

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OVERVIEW

Scan What You Can. Probe What You Cannot.

The FreeProbe Series is designed to complement 3D scanning. In many inspection and reverse engineering projects, the most efficient workflow is to scan the accessible surface geometry and then probe the specific features that require direct point measurement.

Because the FreeProbe works within the same optical tracking environment as the scanner, scanned surfaces and probed features can be captured together in one coordinated measurement workflow. This reduces the need to switch equipment, manually align separate datasets, or create incomplete inspection reports when critical features are not visible to the scanner.

For manufacturers, inspection teams, and service providers working with complex parts, tooling, fixtures, and assemblies, the FreeProbe Series provides a practical way to complete measurement tasks that optical scanning alone cannot fully address.

Why Choose the FreeProbe Series?

• Optical probing adds direct point measurement to FreeScan Trak Nova and FreeScan Trak ProW workflows.
• Measures hard-to-reach features such as deep bores, hidden datums, internal corners, and recessed geometry.
• Complements 3D scanning by capturing features that are difficult or impossible to scan optically.
• Single coordinated workflow keeps scanned surfaces and probed features in the same measurement environment.
• Reduces equipment changes by combining scanning and probing within the Dynamic Tracking system.
• Wireless operation provides freedom of movement around large parts, fixtures, and assemblies.
• Supports complete inspection workflows for parts where surface scanning alone is not enough.

Example Applications

The FreeProbe Series can support a wide range of inspection and feature-measurement workflows. Common examples include:

• Deep bores, holes, slots, and recessed features
• Datum features, alignment points, and hard-to-reach geometry
• Tooling, fixtures, jigs, and production systems
• Dimensional inspection and quality control
• Reverse engineering of complex mechanical components
• Large-part measurement with FreeScan Trak Nova or Trak ProW